HIOKI FA1116
summary
Features of HIOKI FA1116 flying needle tester:
- Capacitance measurement, high-speed optical plate tester
- Max.100 points/second high-speed test
- The test time of gold-plated substrate and micro-circuit substrate is increased by 30%
- With the new probe CP1702-01 and the optimal soft landing control, the high-speed test of micro-circuit is realized.
- Through the high-resolution capacitance measurement of 5aF, the tiny defects lacking in individual lines can be detected.
- It can be tested from ordinary optical plates to fine and high-precision substrates such as FPC, BGA, CSP and MCM.
- Minimum pad size 15um
- In addition to capacitance measurement, the standard is equipped with resistance, inductance, diode and voltage measurement.
- In addition, through MLCC measurement function, capacitance measurement can also be realized under the requirements of JIS specification.
- Through the combination of rich measurement functions and option units, the parking time of the substrate to be measured in the field is reduced.
parameter
Specification parameters of HIOKI FA1116 flying needle tester:
| Number of arms |
2 |
| Test steps |
Up to 40,000 steps /piece 300,000 steps /sheet |
| Test range |
DC measurement function Resistance: 400 μΩ〜40 MΩ Capacitance: 4 μ f400mf Diode and triode (VF): 025 V. Zener diode (vz): 0 ~ 25 v Short circuit: 400 mΩ～40 kΩ Open circuit: 4 Ω ~ 4 mΩ Voltage: 0〜25 V
AC measurement function Resistance: 100 Ω〜100 MΩ Capacitance: 10ff10μ f Inductance: 10 μH〜100 mH
|
| testTime | Max.100 points/s(0.1 mm moving, 2 ァーム simultaneous ロービング, when measuring capacity) |
| Probe measurable area |
610W × 510D mm |
| Measurable substrate size |
Thickness: 0.1〜3.2 mm Appearance: 50w× 50d610w× 510mm Mounting range of components: 10 mm (including plate thickness) from the top and 0.1 mm from the bottom. |
| Substrate transfer | No automatic transmission specification |
| Power Supply |
AC200 V ±10%(single phase) 50/60 Hz, 3 kVA |
| Size and weight |
1443W × 1656H × 1185D mm, 1000 kg |
